SPAD – Single Photon Avalanche Diode – is a silicon pixel technology allowing for single photon counting. Therefore, SPAD based sensors can be used in high speed and low light applications. One of these applications is the Raman spectroscopy which is widely used for material identification, based on the Raman scattering phenomenon. Material identification is performed through exposure of a sample to monochromatic light while measuring the Raman spectrum. For this application, Fraunhofer IMS has developed a fast SPAD CMOS based 2 × 128 pixel digital line sensor.
In order to fully characterize and certify the sensor for this application, we offer a master thesis on the development of a dedicated demonstrator and characterization camera system. The system should consist of an LED laser module (for material excitation), optical system (light monochromatization and focusing), the SPAD sensor itself with dedicated PCB (detection of the scattered light and sensor operation) and sensor readout circuit based on either FPGA or a microcontroller. In addition, you will implement a dedicated PC software and FPGA / microcontroller firmware to automatize the sensor characterization process.